Slawomir Pilarski

According to our database1, Slawomir Pilarski authored at least 26 papers between 1987 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
Delayed Reward Bernoulli Bandits: Optimal Policy and Predictive Meta-Algorithm PARDI.
IEEE Trans. Artif. Intell., 2022

2021
Optimal Policy for Bernoulli Bandits: Computation and Algorithm Gauge.
IEEE Trans. Artif. Intell., 2021

2004
Efficient equivalence checking with partitions and hierarchical cut-points.
Proceedings of the 41th Design Automation Conference, 2004

2002
Speeding up SAT for EDA.
Proceedings of the 2002 Design, 2002

SAT with partial clauses and back-leaps.
Proceedings of the 39th Design Automation Conference, 2002

1997
Pitfalls in delay fault testing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

1996
Delay Fault Testing: How Robust are Our Models?
Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

1995
Comments on "Test efficiency analysis of random self-test of sequential circuits".
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Counter-Based Compaction: Delay and Stuck-Open Faults.
IEEE Trans. Computers, 1995

Comments on "Aliasing Properties of Circular MISRs".
J. Electron. Test., 1995

Non-Robust versus Robust.
Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

Quality considerations in delay fault testing.
Proceedings of the Proceedings EURO-DAC'95, 1995

1994
On minimizing aliasing in scan-based compaction.
J. Electron. Test., 1994

1993
Sequential faults and aliasing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993

Notes on Multiple Input Signature Analysis.
IEEE Trans. Computers, 1993

Simple Bounds on the Convergence Rate of an Ergodic Markov Chain.
Inf. Process. Lett., 1993

BIST and Delay Fault Detection.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992
Checkpointing for Distributed Databases: Starting from the Basics.
IEEE Trans. Parallel Distributed Syst., 1992

Estimating testing effectiveness of the circular self-test path technique.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

Performance of signature analysis: a survey of bounds, exact, and heuristic algorithms.
Integr., 1992

Counter-based compaction: An analysis for BIST.
J. Electron. Test., 1992

Built-in self-test design for large embedded PLAs.
Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992

High Quality Testing of Embedded RAMs Using Circular Self-Test Path.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1990
A Novel Checkpointing Scheme for Distributed Database Systems.
Proceedings of the Ninth ACM SIGACT-SIGMOD-SIGART Symposium on Principles of Database Systems, 1990

1989
Circular self-test path: a low-cost BIST technique for VLSI circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989

1987
Circular Self-Test Path: A Low-Cost BIST Technique.
Proceedings of the 24th ACM/IEEE Design Automation Conference. Miami Beach, FL, USA, June 28, 1987


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