Siva Sudani

According to our database, Siva Sudani authored at least 11 papers between 2011 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2016

Low cost ultra-pure sine wave generation with self calibration.

Yuming Zhuang, Akhilesh Kesavan Unnithan, Arun Joseph, Siva Sudani, Benjamin Magstadt, Degang Chen

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods.

Siva Kumar Sudani, Li Xu, Degang Chen

IEEE Des. Test, 2015

A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit.

Xu Zhang, Chongli Cai, Hao Meng, Siva Sudani, Randall L. Geiger, Degang Chen

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

2014

Efficient Spectral Testing With Clipped and Noncoherently Sampled Data.

Li Xu, Siva Kumar Sudani, Degang Chen

IEEE Trans. Instrum. Meas., 2014

2013

FIRE: A Fundamental Identification and Replacement Method for Accurate Spectral Test Without Requiring Coherency.

Siva Kumar Sudani, Degang Chen

IEEE Trans. Instrum. Meas., 2013

Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique.

Bharath Karthik Vasan, Siva Kumar Sudani, Degang Chen, Randall L. Geiger

IEEE Trans. Circuits Syst. I Regul. Pap., 2013

Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping.

Siva Sudani, Li Xu, Degang Chen

Proceedings of the 2013 IEEE International Test Conference, 2013

High resolution ADC spectral test with known impure source and non-coherent sampling.

Siva Sudani, Degang Chen, Randall L. Geiger

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

2012

A method for accurate full spectrum testing without requiring coherency.

Siva Sudani, Degang Chen, Randy Geiger

Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

Sinusoidal signal generation for production testing and BIST applications.

Bharath K. Vasan, Siva Sudani, Degang Chen, Randall L. Geiger

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

2011

A novel robust and accurate spectral testing method for non-coherent sampling.

Siva Sudani, Minshun Wu, Degang Chen

Proceedings of the 2011 IEEE International Test Conference, 2011