Sina Bakhtavari Mamaghani

According to our database, Sina Bakhtavari Mamaghani authored at least 7 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM.

Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

MBIST-based MRAM defect screening for safety-critical applications.

Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi B. Tahoori

Proceedings of the IEEE International Test Conference, 2024

MBIST-based weak bit screening method for embedded MRAM.

Jongsin Yun, Sina Bakhtavari Mamaghani, Mehdi B. Tahoori, Christopher Münch, Martin Keim

Proceedings of the IEEE European Test Symposium, 2024

Analog Printed Spiking Neuromorphic Circuit.

Priyanjana Pal, Haibin Zhao, Maha Shatta, Michael Hefenbrock, Sina Bakhtavari Mamaghani, Sani R. Nassif, Michael Beigl, Mehdi B. Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures.

Sina Bakhtavari Mamaghani, Priyanjana Pal, Mehdi Baradaran Tahoori

Proceedings of the 29th Asia and South Pacific Design Automation Conference, 2024

2023

Smart Hammering: A practical method of pinhole detection in MRAM memories.

Sina Bakhtavari Mamaghani, Christopher Münch, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2020

Design of an efficient fully nonvolatile and radiation-hardened majority-based magnetic full adder using FinFET/MTJ.

Sina Bakhtavari Mamaghani, Mohammad Hossein Moaiyeri, Ghassem Jaberipur

Microelectron. J., 2020