Sina Bakhtavari Mamaghani

According to our database1, Sina Bakhtavari Mamaghani authored at least 6 papers between 2020 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2024
Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

MBIST-based weak bit screening method for embedded MRAM.
Proceedings of the IEEE European Test Symposium, 2024

Analog Printed Spiking Neuromorphic Circuit.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures.
Proceedings of the 29th Asia and South Pacific Design Automation Conference, 2024

2023
Smart Hammering: A practical method of pinhole detection in MRAM memories.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2020
Design of an efficient fully nonvolatile and radiation-hardened majority-based magnetic full adder using FinFET/MTJ.
Microelectron. J., 2020


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