Simone Gerardin
Orcid: 0000-0002-1260-0586
According to our database1,
Simone Gerardin
authored at least 20 papers
between 2006 and 2022.
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Bibliography
2022
Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing.
IEEE J. Solid State Circuits, 2022
2021
First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics.
IEEE Trans. Emerg. Top. Comput., 2021
2020
Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020
2018
2015
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments.
Proceedings of the 6th International Workshop on Advances in Sensors and Interfaces, 2015
2014
Microelectron. Reliab., 2014
Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences.
Proceedings of the 44th European Solid State Device Research Conference, 2014
2012
Microelectron. Reliab., 2012
High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies.
Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012
2010
Microelectron. Reliab., 2010
Microelectron. Reliab., 2010
2009
Proceedings of the 27th IEEE VLSI Test Symposium, 2009
Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009
2008
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008
2007
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.
Microelectron. Reliab., 2007
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs.
Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
2006
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress.
Microelectron. Reliab., 2006
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab., 2006