Simone Borri

According to our database, Simone Borri authored at least 12 papers between 2002 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Characterization of noise regimes in Mid-IR free-space optical communication based on quantum cascade lasers.

Marco Seminara, Tecla Gabbrielli, Nicola Corrias, Simone Borri, Luigi Consolino, Marco Meucci, Paolo De Natale, Francesco Cappelli, Jacopo Catani

CoRR, 2022

2016

Tunable Microcavity-Stabilized Quantum Cascade Laser for Mid-IR High-Resolution Spectroscopy and Sensing.

Simone Borri, Mario Siciliani de Cumis, Giacomo Insero, Saverio Bartalini, Pablo Cancio Pastor, Davide Mazzotti, Iacopo Galli, Giovanni Giusfredi, Gabriele Santambrogio, Anatoliy Savchenkov, Danny Eliyahu, Vladimir Ilchenko, Naota Akikusa, Andrey Matsko, Lute Maleki, Paolo De Natale

Sensors, 2016

2006

ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions.

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan

J. Electron. Test., 2006

2005

Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories.

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Hage-Hassan

J. Electron. Test., 2005

Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.

Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel

J. Electron. Test., 2005

2004

March iC-: An Improved Version of March C- for ADOFs Detection.

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution.

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan

Proceedings of the 9th European Test Symposium, 2004

Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003

Defect-oriented dynamic fault models for embedded-SRAMs.

Simone Borri, Magali Hage-Hassan, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 8th European Test Workshop, 2003

Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders.

Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2002

A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios.

Emmanuel Rondey, Yann Tellier, Simone Borri

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios.

Emmanuel Rondey, Yann Tellier, Simone Borri

Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002