Simon Thomann

According to our database, Simon Thomann authored at least 34 papers between 2019 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Energy-Efficient Cryogenic Ternary Content Addressable Memory using Ferroelectric SQUID.

Shamiul Alam, Simon Thomann, Shivendra Singh Parihar, Yogesh Singh Chauhan, Kai Ni, Hussam Amrouch, Ahmedullah Aziz

CoRR, 2024

Algorithm to Technology Co-Optimization for CiM-Based Hyperdimensional Computing.

Mahta Mayahinia, Simon Thomann, Paul R. Genssler, Christopher Münch, Hussam Amrouch, Mehdi B. Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

DropHD: Technology/Algorithm Co-Design for Reliable Energy-Efficient NVM-Based Hyper-Dimensional Computing Under Voltage Scaling.

Paul R. Genssler, Mahta Mayahinia, Simon Thomann, Mehdi B. Tahoori, Hussam Amrouch

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023

HW/SW Co-Design for Reliable TCAM- Based In-Memory Brain-Inspired Hyperdimensional Computing.

Simon Thomann, Paul R. Genssler, Hussam Amrouch

IEEE Trans. Computers, August, 2023

FDSOI-Based Analog Computing for Ultra-Efficient Hamming Distance Similarity Calculation.

Albi Mema, Simon Thomann, Paul R. Genssler, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., July, 2023

Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction.

Shubham Kumar, Swetaki Chatterjee, Simon Thomann, Yogesh Singh Chauhan, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., July, 2023

Compact CMOS-Compatible Majority Gate Using Body Biasing in FDSOI Technology.

Brunno Alves de Abreu, Albi Mema, Simon Thomann, Guilherme Paim, Paulo F. Flores, Sergio Bampi, Hussam Amrouch

IEEE J. Emerg. Sel. Topics Circuits Syst., March, 2023

Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K.

Shivendra Singh Parihar, Victor M. van Santen, Simon Thomann, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., 2023

Cryogenic In-Memory Computing for Quantum Processors Using Commercial 5-nm FinFETs.

Shivendra Singh Parihar, Simon Thomann, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch

IEEE Open J. Circuits Syst., 2023

HW/SW Codesign for Robust and Efficient Binarized SNNs by Capacitor Minimization.

Mikail Yayla, Simon Thomann, Ming-Liang Wei, Chia-Lin Yang, Jian-Jia Chen, Hussam Amrouch

CoRR, 2023

Compact and High-Performance TCAM Based on Scaled Double-Gate FeFETs.

Liu Liu, Shubham Kumar, Simon Thomann, Yogesh Singh Chauhan, Hussam Amrouch, Xiaobo Sharon Hu

CoRR, 2023

Reliable Brain-inspired AI Accelerators using Classical and Emerging Memories.

Mikail Yayla, Simon Thomann, Md. Mazharul Islam, Ming-Liang Wei, Shu-Yin Ho, Ahmedullah Aziz, Chia-Lin Yang, Jian-Jia Chen, Hussam Amrouch

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

ML-TCAD: Perspectives and Challenges on Accelerating Transistor Modeling using ML.

Rodion Novkin, Simon Thomann, Hussam Amrouch

Proceedings of the 5th ACM/IEEE Workshop on Machine Learning for CAD, 2023

Analysis and Characterization of Defects in FeFETs.

Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2023

Reliable FeFET-based Neuromorphic Computing through Joint Modeling of Cycle-to-Cycle Variability, Device-to-Device Variability, and Domain Stochasticity.

Simon Thomann, Albi Mema, Kai Ni, Hussam Amrouch

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Energy-efficient Computation-In-Memory Architecture using Emerging Technologies.

Rajendra Bishnoi, Sumit Diware, Anteneh Gebregiorgis, Simon Thomann, Sara Mannaa, Bastien Deveautour, Cédric Marchand, Alberto Bosio, Damien Deleruyelle, Ian O'Connor, Hussam Amrouch, Said Hamdioui

Proceedings of the International Conference on Microelectronics, 2023

5nm FinFET Cryogenic SRAM Evaluation for Quantum Computing.

Shivendra Singh Parihar, Simon Thomann, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch

Proceedings of the Device Research Conference, 2023

Compact and High-Performance TCAM Based on Scaled Double-Gate FeFETs.

Liu Liu, Shubham Kumar, Simon Thomann, Hussam Amrouch, Xiaobo Sharon Hu

Proceedings of the 60th ACM/IEEE Design Automation Conference, 2023

Tutorial: The Synergy of Hyperdimensional and In-Memory Computing.

Paul R. Genssler, Simon Thomann, Hussam Amrouch

Proceedings of the International Conference on Hardware/Software Codesign and System Synthesis, 2023

2022

Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture.

Mikail Yayla, Simon Thomann, Sebastian Buschjäger, Katharina Morik, Jian-Jia Chen, Hussam Amrouch

IEEE Trans. Circuits Syst. I Regul. Pap., 2022

HW/SW Co-design for Reliable In-memory Brain-inspired Hyperdimensional Computing.

Simon Thomann, Paul R. Genssler, Hussam Amrouch

CoRR, 2022

Cross-layer FeFET Reliability Modeling for Robust Hyperdimensional Computing.

Shubham Kumar, Swetaki Chatterjee, Simon Thomann, Paul R. Genssler, Yogesh Singh Chauhan, Hussam Amrouch

Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022

HW/SW Codesign for Approximate In-Memory Computing.

Simon Thomann, Hong L. G. Nguyen, Hussam Amrouch

Proceedings of the 23rd International Symposium on Quality Electronic Design, 2022

Suppressing Channel Percolation in Ferroelectric FET for Reliable Neuromorphic Applications.

Kai Ni, Om Prakash, Simon Thomann, Zijian Zhao, Shan Deng, Hussam Amrouch

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Mitigating the Impact of Variability in NCFET-based Coupled-Oscillator Networks Applications.

Juan Núñez, Simon Thomann, Hussam Amrouch, Maria J. Avedillo

Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022

Joint Modeling of Multi-Domain Ferroelectric and Distributed Channel towards Unveiling the Asymmetric Abrupt DC Current Jump in Ferroelectric FET.

Simon Thomann, Kai Ni, Hussam Amrouch

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021

On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM.

Simon Thomann, Chao Li, Cheng Zhuo, Om Prakash, Xunzhao Yin, Xiaobo Sharon Hu, Hussam Amrouch

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks.

Victor M. van Santen, Simon Thomann, Yogesh S. Chauchan, Jörg Henkel, Hussam Amrouch

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

ICCAD Tutorial Session Paper Ferroelectric FET Technology and Applications: From Devices to Systems.

Hussam Amrouch, Di Gao, Xiaobo Sharon Hu, Arman Kazemi, Ann Franchesca Laguna, Kai Ni, Michael T. Niemier, Mohammad Mehdi Sharifi, Simon Thomann, Xunzhao Yin, Cheng Zhuo

Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021

Cross-layer Design for Computing-in-Memory: From Devices, Circuits, to Architectures and Applications.

Hussam Amrouch, Xiaobo Sharon Hu, Mohsen Imani, Ann Franchesca Laguna, Michael T. Niemier, Simon Thomann, Xunzhao Yin, Cheng Zhuo

Proceedings of the ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, 2021

2020

BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity.

Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET.

Kai Ni, Aniket Gupta, Om Prakash, Simon Thomann, Xiaobo Sharon Hu, Hussam Amrouch

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology.

Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel, Hussam Amrouch

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

Reliability Challenges with Self-Heating and Aging in FinFET Technology.

Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019