Siddharth Rao
Orcid: 0000-0001-6161-3052
According to our database1,
Siddharth Rao
authored at least 24 papers
between 2017 and 2024.
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Bibliography
2024
Proceedings of the IEEE International Test Conference, 2024
Proceedings of the IEEE European Test Symposium, 2024
Proceedings of the 29th Asia and South Pacific Design Automation Conference, 2024
2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Proceedings of the IEEE International Memory Workshop, 2023
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023
Proceedings of the 32nd IEEE Asian Test Symposium, 2023
2022
MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
IEEE Trans. Computers, 2022
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
Selective operations of multi-pillar SOT-MRAM for high density and low power embedded memories.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
IEEE Trans. Emerg. Top. Comput., 2021
Proceedings of the IEEE International Test Conference, 2021
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
2020
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs.
Proceedings of the IEEE International Test Conference, 2020
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020
2019
Proceedings of the IEEE International Test Conference, 2019
Proceedings of the 24th IEEE European Test Symposium, 2019
2018
Proceedings of the IEEE International Test Conference, 2018
2017
Cross-layer design and analysis of a low power, high density STT-MRAM for embedded systems.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017