Sicong Yuan

According to our database, Sicong Yuan authored at least 13 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2025

Device-Aware Test for Anomalous Charge Trapping in FeFETs.

Sicong Yuan, Changhao Wang, Moritz Fieback, Hanzhi Xun, Mottaqiallah Taouil, Xiuyan Li, Danyang Chen, Lin Wang, Nicolò Bellarmino, Riccardo Cantoro, Said Hamdioui

Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2024

Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment?

Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2024

Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs.

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2024

Defects, Fault Modeling, and Test Development Framework for FeFETs.

Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2024

Design-for-Test for Intermittent Faults in STT-MRAMs.

Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2024

Online Detection of Unique Faults in RRAMs.

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2024

Device-Aware Diagnosis for Yield Learning in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023

Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs.

Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2023

Device-Aware Test for Ion Depletion Defects in RRAMs.

Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE International Test Conference, 2023

Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2023

Device-Aware Test for Back-Hopping Defects in STT-MRAMs.

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Characterization and Test of Intermittent Over RESET in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

Device Aware Diagnosis for Unique Defects in STT-MRAMs.

Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 32nd IEEE Asian Test Symposium, 2023