Sicong Yuan

According to our database1, Sicong Yuan authored at least 12 papers between 2023 and 2024.

Collaborative distances:

Timeline

2023
2024
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Bibliography

2024
Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment?
Proceedings of the IEEE International Test Conference, 2024

Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs.
Proceedings of the IEEE International Test Conference, 2024

Defects, Fault Modeling, and Test Development Framework for FeFETs.
Proceedings of the IEEE International Test Conference, 2024

Design-for-Test for Intermittent Faults in STT-MRAMs.
Proceedings of the IEEE European Test Symposium, 2024

Online Detection of Unique Faults in RRAMs.
Proceedings of the IEEE European Test Symposium, 2024

Device-Aware Diagnosis for Yield Learning in RRAMs.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs.
Proceedings of the IEEE International Test Conference, 2023

Device-Aware Test for Ion Depletion Defects in RRAMs.
Proceedings of the IEEE International Test Conference, 2023

Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs.
Proceedings of the IEEE European Test Symposium, 2023

Device-Aware Test for Back-Hopping Defects in STT-MRAMs.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Characterization and Test of Intermittent Over RESET in RRAMs.
Proceedings of the 32nd IEEE Asian Test Symposium, 2023

Device Aware Diagnosis for Unique Defects in STT-MRAMs.
Proceedings of the 32nd IEEE Asian Test Symposium, 2023


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