Shuting Shi

Orcid: 0009-0008-9597-4532

According to our database1, Shuting Shi authored at least 14 papers between 2013 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
A Downscaling Framework for Urban Nighttime Light Based on Multifactor Geographically Neural Network Weighted Regression.
IEEE Trans. Geosci. Remote. Sens., 2024

Causality-Guided Stepwise Intervention and Reweighting for Remote Sensing Image Semantic Segmentation.
IEEE Trans. Geosci. Remote. Sens., 2024

Ranking-Aware Unbiased Post-Click Conversion Rate Estimation via AUC Optimization on Entire Exposure Space.
Proceedings of the 18th ACM Conference on Recommender Systems, 2024

2021
Deep Transfer Bug Localization.
IEEE Trans. Software Eng., 2021

Radiation Tolerant SRAM Cell Design in 65nm Technology.
J. Electron. Test., 2021

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor.
J. Electron. Test., 2021

2020
Learning Code Changes by Exploiting Bidirectional Converting Deviation.
Proceedings of The 12th Asian Conference on Machine Learning, 2020

Deep Time-Stream Framework for Click-through Rate Prediction by Tracking Interest Evolution.
Proceedings of the Thirty-Fourth AAAI Conference on Artificial Intelligence, 2020

2019
DeepReview: Automatic Code Review Using Deep Multi-instance Learning.
Proceedings of the Advances in Knowledge Discovery and Data Mining, 2019

Automatic Code Review by Learning the Revision of Source Code.
Proceedings of the Thirty-Third AAAI Conference on Artificial Intelligence, 2019

2018
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.
Microelectron. Reliab., 2018

2016
Layout-based Single Event Mitigation Techniques for Dynamic Logic Circuits.
J. Electron. Test., 2016

2014
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.
J. Electron. Test., 2014

2013
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.
J. Electron. Test., 2013


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