Shupeng Sun

According to our database, Shupeng Sun authored at least 16 papers between 2012 and 2019.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of four.

2019

Nonlinear Dynamic Modeling and Model Reduction Strategy for Rotating Thin Cylindrical Shells.

Shupeng Sun, Lun Liu

Complex., 2019

2018

Sparse Regression Driven Mixture Importance Sampling for Memory Design.

Maria Malik, Rajiv V. Joshi, Rouwaida Kanj, Shupeng Sun, Houman Homayoun, Tong Li

IEEE Trans. Very Large Scale Integr. Syst., 2018

2017

Machine Learning for Noise Sensor Placement and Full-Chip Voltage Emergency Detection.

Xiaochen Liu, Shupeng Sun, Xin Li, Haifeng Qian, Pingqiang Zhou

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

2016

Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data.

Fa Wang, Paolo Cachecho, Wangyang Zhang, Shupeng Sun, Xin Li, Rouwaida Kanj, Chenjie Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

2015

Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space.

Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

A statistical methodology for noise sensor placement and full-chip voltage map generation.

Xiaochen Liu, Shupeng Sun, Pingqiang Zhou, Xin Li, Haifeng Qian

Proceedings of the 52nd Annual Design Automation Conference, 2015

Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space.

Shupeng Sun, Xin Li

Proceedings of the 2015 IEEE Custom Integrated Circuits Conference, 2015

Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space.

Shupeng Sun, Xin Li

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

2014

Indirect Performance Sensing for On-Chip Self-Healing of Analog and RF Circuits.

Shupeng Sun, Fa Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileggi, Arun Natarajan, Mark A. Ferriss, Jean-Olivier Plouchart, Bodhisatwa Sadhu, Benjamin D. Parker, Alberto Valdes-Garcia, Mihai A. T. Sanduleanu, José A. Tierno, Daniel J. Friedman

IEEE Trans. Circuits Syst. I Regul. Pap., 2014

Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space.

Shupeng Sun, Xin Li

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

2013

Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits.

Xin Li, Fa Wang, Shupeng Sun, Chenjie Gu

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013

Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data.

Fa Wang, Wangyang Zhang, Shupeng Sun, Xin Li, Chenjie Gu

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion.

Shupeng Sun, Fa Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileggi, Arun Natarajan, Mark A. Ferriss, Jean-Olivier Plouchart, Bodhisatwa Sadhu, Benjamin D. Parker, Alberto Valdes-Garcia, Mihai A. T. Sanduleanu, José A. Tierno, Daniel J. Friedman

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits.

Shupeng Sun, Xin Li, Chenjie Gu

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

2012

Efficient SRAM Failure Rate Prediction via Gibbs Sampling.

Shupeng Sun, Yamei Feng, Changdao Dong, Xin Li

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion.

Xin Li, Wangyang Zhang, Fa Wang, Shupeng Sun, Chenjie Gu

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012