Shun-Bao Chang
According to our database1,
Shun-Bao Chang
authored at least 2 papers
in 2015.
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Bibliography
2015
ESD reliability building in 0.25 μm 60-V p-channel LDMOS DUTs with different embedded SCRs.
Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2015
Anti-ESD impacts on 60-V P-channel LDMOS devices as none-ODs zone inserting in the bulk region.
Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2015