Shuichi Ishida

Orcid: 0000-0002-7040-4604

According to our database1, Shuichi Ishida authored at least 10 papers between 2009 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
Factors Affecting Information and Communication Technology Development on a National Scale.
Proceedings of the IEEE International Conference on Industrial Engineering and Engineering Management, 2023

Utilizing Deep Learning for Semi-Automatic Conversation Analysis During Recruitment and Employee Education in the Seed Phase of High-Tech Startups.
Proceedings of the IEEE International Conference on Industrial Engineering and Engineering Management, 2023

2022
Human Resources Strategies in High-tech Startups during the Seed Phase: The Relationship between Recruitment, Career, and Tolerance of Uncertainty.
Proceedings of the IEEE International Conference on Industrial Engineering and Engineering Management, 2022

2019
Monitoring of the core body temperature of cows using implantable wireless thermometers.
Comput. Electron. Agric., 2019

A Source Domain Extension Method for Inductive Transfer Learning Based on Flipping Output.
Algorithms, 2019

2018
Label Estimation Method with Modifications for Unreliable Examples in Taming.
Int. J. Netw. Comput., 2018

2017
Exploratory research on the mechanism of latecomer advantages in the Asian LCD industry.
Int. J. Technol. Manag., 2017

2014
The contribution of technology to improving meanings: The quantitative analysis of meanings.
Proceedings of the 2014 IEEE International Conference on Industrial Engineering and Engineering Management, 2014

2013
The timing of interorganisational collaborations in an emerging biopharmaceutical field: evidence from Japan in comparison to the remaining RNAi field.
Technol. Anal. Strateg. Manag., 2013

2009
Transport properties and observation of quantum Hall effects of InAs<sub>0.1</sub>Sb<sub>0.9</sub> thin layers sandwiched between Al<sub>0.1</sub>In<sub>0.9</sub>Sb layers.
Microelectron. J., 2009


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