Shoji Ikeda

Orcid: 0000-0002-3925-4089

According to our database1, Shoji Ikeda authored at least 23 papers between 2007 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Dual-Port SOT-MRAM Achieving 90-MHz Read and 60-MHz Write Operations Under Field-Assistance-Free Condition.
IEEE J. Solid State Circuits, 2021

2020
Dual-Port Field-Free SOT-MRAM Achieving 90-MHz Read and 60-MHz Write Operations under 55-nm CMOS Technology and 1.2-V Supply Voltage.
Proceedings of the IEEE Symposium on VLSI Circuits, 2020

2019
A 47.14-µW 200-MHz MOS/MTJ-Hybrid Nonvolatile Microcontroller Unit Embedding STT-MRAM and FPGA for IoT Applications.
IEEE J. Solid State Circuits, 2019

A novel memory test system with an electromagnet for STT-MRAM testing.
Proceedings of the 19th Non-Volatile Memory Technology Symposium, 2019

An FPGA-Accelerated Fully Nonvolatile Microcontroller Unit for Sensor-Node Applications in 40nm CMOS/MTJ-Hybrid Technology Achieving 47.14μW Operation at 200MHz.
Proceedings of the IEEE International Solid- State Circuits Conference, 2019

2016
Standby-Power-Free Integrated Circuits Using MTJ-Based VLSI Computing.
Proc. IEEE, 2016

An Overview of Nonvolatile Emerging Memories - Spintronics for Working Memories.
IEEE J. Emerg. Sel. Topics Circuits Syst., 2016

2015
Nonvolatile Logic-in-Memory LSI Using Cycle-Based Power Gating and its Application to Motion-Vector Prediction.
IEEE J. Solid State Circuits, 2015

Fabrication of a 3000-6-input-LUTs embedded and block-level power-gated nonvolatile FPGA chip using p-MTJ-based logic-in-memory structure.
Proceedings of the Symposium on VLSI Circuits, 2015

2014
Advances in spintronics devices for microelectronics - From spin-transfer torque to spin-orbit torque.
Proceedings of the 19th Asia and South Pacific Design Automation Conference, 2014

2013
A 1 Mb Nonvolatile Embedded Memory Using 4T2MTJ Cell With 32 b Fine-Grained Power Gating Scheme.
IEEE J. Solid State Circuits, June, 2013

Fabrication of a magnetic tunnel junction-based 240-tile nonvolatile field-programmable gate array chip skipping wasted write operations for greedy power-reduced logic applications.
IEICE Electron. Express, 2013

Nonvolatile logic-in-memory array processor in 90nm MTJ/MOS achieving 75% leakage reduction using cycle-based power gating.
Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

2012
1Mb 4T-2MTJ nonvolatile STT-RAM for embedded memories using 32b fine-grained power gating technique with 1.0ns/200ps wake-up/power-off times.
Proceedings of the Symposium on VLSI Circuits, 2012

A 3.14 um<sup>2</sup> 4T-2MTJ-cell fully parallel TCAM based on nonvolatile logic-in-memory architecture.
Proceedings of the Symposium on VLSI Circuits, 2012

Implementation of a perpendicular MTJ-based read-disturb-tolerant 2T-2R nonvolatile TCAM based on a reversed current reading scheme.
Proceedings of the 17th Asia and South Pacific Design Automation Conference, 2012

2010
A 32-Mb SPRAM With 2T1R Memory Cell, Localized Bi-Directional Write Driver and '1'/'0' Dual-Array Equalized Reference Scheme.
IEEE J. Solid State Circuits, 2010

Transient Characteristic of Fabricated Magnetic Tunnel Junction (MTJ) Programmed with CMOS Circuit.
IEICE Trans. Electron., 2010

Study of the DC Performance of Fabricated Magnetic Tunnel Junction Integrated on Back-End Metal Line of CMOS Circuits.
IEICE Trans. Electron., 2010

2009
MTJ-based nonvolatile logic-in-memory circuit, future prospects and issues.
Proceedings of the Design, Automation and Test in Europe, 2009

2008
2 Mb SPRAM (SPin-Transfer Torque RAM) With Bit-by-Bit Bi-Directional Current Write and Parallelizing-Direction Current Read.
IEEE J. Solid State Circuits, 2008

2007
2Mb Spin-Transfer Torque RAM (SPRAM) with Bit-by-Bit Bidirectional Current Write and Parallelizing-Direction Current Read.
Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007


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