Shobha Vasudevan
Orcid: 0000-0002-6995-3219
According to our database1,
Shobha Vasudevan
authored at least 61 papers
between 2004 and 2024.
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Bibliography
2024
ARISTOTLE: Feature Engineering for Scalable Application-Level Post-Silicon Debugging.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., September, 2024
2021
CoRR, 2021
Proceedings of the Advances in Neural Information Processing Systems 34: Annual Conference on Neural Information Processing Systems 2021, 2021
2020
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Emphasizing Functional Relevance Over State Restoration in Post-Silicon Signal Tracing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
2019
Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019
Proceedings of the 24th Asia and South Pacific Design Automation Conference, 2019
2018
Proceedings of the 55th Annual Design Automation Conference, 2018
Automated Generation and Selection of Interpretable Features for Enterprise Security.
Proceedings of the IEEE International Conference on Big Data (IEEE BigData 2018), 2018
2017
Integr., 2017
Proceedings of the IEEE International Conference on Rebooting Computing, 2017
2016
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016
Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016
Duplex: simultaneous parameter-performance exploration for optimizing analog circuits.
Proceedings of the 35th International Conference on Computer-Aided Design, 2016
Every test makes a difference: Compressing analog tests to decrease production costs.
Proceedings of the 21st Asia and South Pacific Design Automation Conference, 2016
2015
Can't See the Forest for the Trees: State Restoration's Limitations in Post-silicon Trace Signal Selection.
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015
Proceedings of the 2015 Symposium and Bootcamp on the Science of Security, 2015
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015
2014
ACM Trans. Design Autom. Electr. Syst., 2014
Efficient Statistical Model Checking of Hardware Circuits With Multiple Failure Regions.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014
Proceedings of the 2014 27th International Conference on VLSI Design, 2014
Proceedings of the 51st Annual Design Automation Conference 2014, 2014
2013
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013
J. Electron. Test., 2013
Using automatically generated invariants for regression testing and bug localization.
Proceedings of the 2013 28th IEEE/ACM International Conference on Automated Software Engineering, 2013
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013
Proceedings of the Great Lakes Symposium on VLSI 2013 (part of ECRC), 2013
Proceedings of the Great Lakes Symposium on VLSI 2013 (part of ECRC), 2013
Reachability analysis of nonlinear analog circuits through iterative reachable set reduction.
Proceedings of the Design, Automation and Test in Europe, 2013
Runtime verification of nonlinear analog circuits using incremental time-augmented RRT algorithm.
Proceedings of the Design, Automation and Test in Europe, 2013
2012
IEEE Trans. Very Large Scale Integr. Syst., 2012
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012
Proceedings of the 49th Annual Design Automation Conference 2012, 2012
Proceedings of the 49th Annual Design Automation Conference 2012, 2012
Proceedings of the 10th International Conference on Hardware/Software Codesign and System Synthesis, 2012
Proceedings of the 17th Asia and South Pacific Design Automation Conference, 2012
2011
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011
Proceedings of the 9th IEEE/ACM International Conference on Formal Methods and Models for Codesign, 2011
Proceedings of the 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011), 2011
Proceedings of the 11th IEEE International Conference on Data Mining, 2011
Scaling probabilistic timing verification of hardware using abstractions in design source code.
Proceedings of the International Conference on Formal Methods in Computer-Aided Design, 2011
Proceedings of the Design, Automation and Test in Europe, 2011
Towards coverage closure: Using GoldMine assertions for generating design validation stimulus.
Proceedings of the Design, Automation and Test in Europe, 2011
2010
Automatic Compositional Reasoning for Probabilistic Model Checking of Hardware Designs.
Proceedings of the QEST 2010, 2010
Proceedings of the 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, 2010
Proceedings of the Design, Automation and Test in Europe, 2010
2009
Dedicated Rewriting: Automatic Verification of Low Power Transformations in Register Transfer Level.
J. Low Power Electron., 2009
Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009
Proceedings of the IEEE International High Level Design Validation and Test Workshop, 2009
2008
Des. Autom. Embed. Syst., 2008
2007
Automatic Verification of Arithmetic Circuits in RTL Using Stepwise Refinement of Term Rewriting Systems.
IEEE Trans. Computers, 2007
Int. J. Softw. Tools Technol. Transf., 2007
Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007
2006
Automatic decomposition for sequential equivalence checking of system level and RTL descriptions.
Proceedings of the 4th ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2006), 2006
Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor.
Proceedings of the 2006 IEEE International Test Conference, 2006
2005
Automated mapping of pre-computed module-level test sequences to processor instructions.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
2004
Proceedings of the Fouth International Workshop on Automated Verification of Critical Systems, 2004
Proceedings of the Building the Information Society, 2004