Shiwei Feng
Orcid: 0000-0001-9038-8309Affiliations:
- Beijing University of Technology, Institute of Semiconductor Device Reliability Physics, Beijing, China
According to our database1,
Shiwei Feng
authored at least 16 papers
between 2013 and 2025.
Collaborative distances:
Collaborative distances:
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Bibliography
2025
Workload variation compensation optimization of ring oscillator temperature measurement method and its application in field-programmable gate array.
Microelectron. J., 2025
2024
IEEE Trans. Instrum. Meas., 2024
Microelectron. J., 2024
Temperature rise detection in GaN high-electron-mobility transistors via gate-drain Schottky junction forward-conduction voltages.
Microelectron. J., 2024
2023
Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection.
IEEE Trans. Instrum. Meas., 2023
A numerical calibration of structure-function transient thermal measurement based on Cauer RC network.
Microelectron. J., 2023
2021
Build-in compact and efficient temperature sensor array on field programmable gate array.
Microelectron. J., 2021
2017
Thermal evaluation of GaN-based HEMTs with various layer sizes and structural parameters using finite-element thermal simulation.
Microelectron. Reliab., 2017
Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test.
Microelectron. J., 2017
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2016
Identifying the spatial position and properties of traps in GaN HEMTs using current transient spectroscopy.
Microelectron. Reliab., 2016
2015
The effect of external stress on the properties of AlGaAs/GaAs single quantum well laser diodes.
Microelectron. Reliab., 2015
All-digital thermal distribution measurement on field programmable gate array using ring oscillators.
Microelectron. Reliab., 2015
Microelectron. Reliab., 2015
Thermal investigation of LED array with multiple packages based on the superposition method.
Microelectron. J., 2015
2013
Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs.
Microelectron. Reliab., 2013