Shipeng Shangguan

Orcid: 0000-0002-5463-4944

According to our database¹, Shipeng Shangguan authored at least 3 papers between 2017 and 2024.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

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Bibliography

2024

Single event effect mechanism study in 130nm fully depleted SOI technology devices.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2024

2020

Study on the single-event upset sensitivity of 65-nm CMOS sequential logic circuit.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2020

2017

Comparison of single-event upset generated by heavy ion and pulsed laser.

[BibT_eX]

[DOI]

Sci. China Inf. Sci., 2017

Shipeng Shangguan

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