Shinji Fujieda

According to our database, Shinji Fujieda authored at least 2 papers between 2005 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

Reliability driven guideline for BEOL Optimization: Protecting MOS stacks from hydrogen-related impurity penetration.

Ziyuan Liu, Fumihiko Hayashi, Shinji Fujieda, Markus Wilde, Katsuyuki Fukutani

Proceedings of the IEEE International Conference on IC Design & Technology, 2012

2005

Characterization of interface defects related to negative-bias temperature instability in ultrathin plasma-nitrided SiON/Si<1 0 0> systems.

Shinji Fujieda, Yoshinao Miura, Motofumi Saitoh, Yuden Teraoka, Akitaka Yoshigoe

Microelectron. Reliab., 2005