Shinichi Yoneda

According to our database, Shinichi Yoneda authored at least 5 papers between 2012 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Reliability Issues in Analog ReRAM Based Neural-Network Processor.

Ryutaro Yasuhara, Takashi Ono, Reiji Mochida, Shunsaku Muraoka, Kazuyuki Kouno, Koji Katayama, Yuriko Hayata, Masayoshi Nakayama, Hitoshi Suwa, Yukio Hayakawa, Takumi Mikawa, Yasushi Gohou, Shinichi Yoneda

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2015

Theoretical and Experimental Approaches to Select Resistive Switching Material.

Takeki Ninomiya, Zhiqiang Wei, Shinichi Yoneda, Kenji Shiraishi

IEICE Trans. Electron., 2015

Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application.

Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, W. Boullart, E. Vecchio, T. Vandeweyer, T. Witters, D. Crotti, M. Jurczak, S. Fujii, S. Ito, Y. Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda

Proceedings of the Symposium on VLSI Circuits, 2015

2013

An 8 Mb Multi-Layered Cross-Point ReRAM Macro With 443 MB/s Write Throughput.

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda, Ken Kawai, Yoshikazu Katoh, Yukio Hayakawa, Kiyotaka Tsuji, Shinichi Yoneda, Atsushi Himeno, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono

IEEE J. Solid State Circuits, 2013

2012

An 8Mb multi-layered cross-point ReRAM macro with 443MB/s write throughput.

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda, Ken Kawai, Yoshikazu Katoh, Kouhei Tanabe, Toshihiro Nakamura, Yoshihiko Sumimoto, Naoki Yamada, Nobuyuki Nakai, Shoji Sakamoto, Yukio Hayakawa, Kiyotaka Tsuji, Shinichi Yoneda, Atsushi Himeno, Ken-ichi Origasa, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono

Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012