Shinichi Nishizawa
Orcid: 0000-0002-1172-7286
According to our database1,
Shinichi Nishizawa
authored at least 41 papers
between 2009 and 2024.
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Bibliography
2024
De-Correlation and De-Bias Post-Processing Circuits for True Random Number Generator.
IEEE Trans. Circuits Syst. I Regul. Pap., November, 2024
Estimating of IGBT Bond Wire Lift-Off Trend Using Convolutional Neural Network (CNN).
IEEE Access, 2024
2023
Area Efficient Approximate 4-2 Compressor and Probability-Based Error Adjustment for Approximate Multiplier.
IEEE Trans. Circuits Syst. II Express Briefs, May, 2023
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., March, 2023
IEEE Access, 2023
Evaluation of Application-Independent Unbiased Approximate Multipliers on Quantized Convolutional Neural Networks.
Proceedings of the 36th IEEE International System-on-Chip Conference, 2023
Proceedings of the 36th IEEE International System-on-Chip Conference, 2023
Prime Factorization Based on Multiple Quantum Annealings on Partial Constraints with Analytical Variable Reduction.
Proceedings of the 36th IEEE International System-on-Chip Conference, 2023
A Hardware-Efficient Approximate Multiplier Combining Inexact Same-weight N:2 Compressors and Remapping Logic with Error Recovery.
Proceedings of the 36th IEEE International System-on-Chip Conference, 2023
2022
NCTUcell: A DDA- and Delay-Aware Cell Library Generator for FinFET Structure With Implicitly Adjustable Grid Map.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
Reduction of LSI Maximum Power Consumption with Standard Cell Library of Stack Structured Cells.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2022
Proceedings of the 23rd International Symposium on Quality Electronic Design, 2022
2021
IPSJ Trans. Syst. LSI Des. Methodol., 2021
2020
Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement.
IPSJ Trans. Syst. LSI Des. Methodol., 2020
MCell: Multi-Row Cell Layout Synthesis with Resource Constrained MAX-SAT Based Detailed Routing.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020
2019
IEICE Electron. Express, 2019
Proceedings of the 20th International Symposium on Quality Electronic Design, 2019
Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019
NCTUcell: A DDA-Aware Cell Library Generator for FinFET Structure with Implicitly Adjustable Grid Map.
Proceedings of the 56th Annual Design Automation Conference 2019, 2019
Proceedings of the 13th IEEE International Conference on ASIC, 2019
2018
Microelectron. Reliab., 2018
ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier.
Microelectron. Reliab., 2018
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2018
Minimization of Vote Operations for Soft Error Detection in DMR Design with Error Correction by Operation Re-Execution.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2018
Proceedings of the 2018 IEEE Symposium on VLSI Circuits, 2018
Proceedings of the 19th International Symposium on Quality Electronic Design, 2018
Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately.
Proceedings of the 48th European Solid-State Device Research Conference, 2018
2017
Proceedings of the 30th IEEE International System-on-Chip Conference, 2017
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2016
Design and Analysis of a New Evaluation Circuit for Capacitors Used in a High-Power Three-Phase Inverter.
IEEE Trans. Ind. Electron., 2016
Temperature rise measurement for power-loss comparison of an aluminum electrolytic capacitor between sinusoidal and square-wave current injections.
Microelectron. Reliab., 2016
2015
IPSJ Trans. Syst. LSI Des. Methodol., 2015
An impact of process variation on supply voltage dependence of logic path delay variation.
Proceedings of the VLSI Design, Automation and Test, 2015
2014
Design methodology of process variation tolerant D-Flip-Flops for low voltage circuit operation.
Proceedings of the 27th IEEE International System-on-Chip Conference, 2014
Proceedings of the 27th IEEE International System-on-Chip Conference, 2014
2013
Standard Cell Structure with Flexible P/N Well Boundaries for Near-Threshold Voltage Operation.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2013
Proceedings of the International Symposium on Quality Electronic Design, 2013
2012
Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2012
A flexible structure of standard cell and its optimization method for near-threshold voltage operation.
Proceedings of the 30th International IEEE Conference on Computer Design, 2012
2011
Modeling of Random Telegraph Noise under circuit operation - Simulation and measurement of RTN-induced delay fluctuation.
Proceedings of the 12th International Symposium on Quality Electronic Design, 2011
2009
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009