Shin Hun

According to our database, Shin Hun authored at least 1 paper in 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM.

Daehyun Chang, Youngdae Kim, Suksoo Pyo, Shin Hun, Daesop Lee, Sohee Hwang, Jaesik Choi, Siwoong Kim

Proceedings of the IEEE International Test Conference, 2023