Shi-Xuan Zheng

According to our database, Shi-Xuan Zheng authored at least 4 papers between 2020 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Efficient Test Compression Configuration Selection.

Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, Chen Wang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Justyna Zawada, Mark Kassab, Janusz Rajski

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations.

Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2020

Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations.

Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada

Proceedings of the IEEE International Test Conference, 2020

Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels.

Fong-Jyun Tsai, Chong-Siao Ye, Yu Huang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Shi-Xuan Zheng

Proceedings of the IEEE International Test Conference in Asia, 2020