Sheng-Tsaing Tseng

According to our database, Sheng-Tsaing Tseng authored at least 20 papers between 1992 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Neural ordinary differential equation for sequential optimal design of fatigue test under accelerated life test analysis.

Marzieh Khakifirooz, Mahdi Fathi, I-Chen Lee, Sheng-Tsaing Tseng

Reliab. Eng. Syst. Saf., July, 2023

2020

Model Misspecification of Generalized Gamma Distribution for Accelerated Lifetime-Censored Data.

Marzieh Khakifirooz, Sheng-Tsaing Tseng, Mahdi Fathi

Technometrics, 2020

2019

Stability conditions and robustness analysis of a general MMSE run-to-run controller.

Sheng-Tsaing Tseng, Fugee Tsung, Jo-Hua Wu

IISE Trans., 2019

2018

Sequential Bayesian Design for Accelerated Life Tests.

I-Chen Lee, Yili Hong, Sheng-Tsaing Tseng, Tirthankar Dasgupta

Technometrics, 2018

2017

A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic Models.

Sheng-Tsaing Tseng, Pei-Yu Chen

Technometrics, 2017

2016

A Multivariate EWMA Controller for Linear Dynamic Processes.

Sheng-Tsaing Tseng, Hsin-Chao Mi, I-Chen Lee

Technometrics, 2016

Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation Models.

Sheng-Tsaing Tseng, I-Chen Lee

Technometrics, 2016

2015

Adaptive Warranty Prediction for Highly Reliable Products.

Nan-Jung Hsu, Sheng-Tsaing Tseng, Ming-Wei Chen

IEEE Trans. Reliab., 2015

2013

Statistical Lifetime Inference With Skew-Wiener Linear Degradation Models.

Chien-Yu Peng, Sheng-Tsaing Tseng

IEEE Trans. Reliab., 2013

2012

Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects.

Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan

IEEE Trans. Reliab., 2012

2011

Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process.

Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan

IEEE Trans. Reliab., 2011

2010

Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products.

Chien-Yu Peng, Sheng-Tsaing Tseng

IEEE Trans. Reliab., 2010

Fault Detection based on Statistical Multivariate Analysis and Microarray-type Visualization.

Ming-Da Ma, David Shan-Hill Wong, Shi-Shang Jang, Sheng-Tsaing Tseng

IEEE Trans. Ind. Informatics, 2010

2009

Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes.

Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan, Chih-Chun Tsai

IEEE Trans. Reliab., 2009

Mis-Specification Analysis of Linear Degradation Models.

Chien-Yu Peng, Sheng-Tsaing Tseng

IEEE Trans. Reliab., 2009

A Technical Note on "Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller".

Sheng-Tsaing Tseng, Bo-Yan Jou

Technometrics, 2009

2007

Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller.

Sheng-Tsaing Tseng, Jen Tang, Chien-Hua Lin

Technometrics, 2007

2006

Optimal design for step-stress accelerated degradation tests.

Chen-Mao Liao, Sheng-Tsaing Tseng

IEEE Trans. Reliab., 2006

2000

Optimal production run length for products sold with warranty.

Ruey-Huei Yeh, Wen-Tsung Ho, Sheng-Tsaing Tseng

Eur. J. Oper. Res., 2000

1992

Use of variable range in solving multiple criteria scheduling problems.

Ching-Jong Liao, Rong-Hwa Huang, Sheng-Tsaing Tseng

Comput. Oper. Res., 1992