Shashank Banchhor

According to our database, Shashank Banchhor authored at least 7 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET.

Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Navneet Gandhi, Shashank Banchhor, Young Suh Song, Navjeet Bagga

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Design optimization Using Symmetric/Asymmetric Spacer for 14 nm Multi-Fin Tri-gate Fin-FET for Mid-Band 5G Applications.

Jyoti Patel, Shashank Banchhor, Surila Guglani, Avirup Dasgupta, Sourajeet Roy, Anand Bulusu, Sudeb Dasgupta

Proceedings of the 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, 2022

Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective.

Aniket Gupta, Govind Bajpai, Navjeet Bagga, Shashank Banchhor, Sudeb Dasgupta, Anand Bulusu, Nitanshu Chauhan

Proceedings of the VLSI Design and Test - 26th International Symposium, 2022

Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI.

Nitanshu Chauhan, Chirag Garg, Kai Ni, Amit Kumar Behera, Sarita Yadav, Shashank Banchhor, Navjeet Bagga, Avirup Dasgupta, Arnab Datta, Sudeb Dasgupta, Anand Bulusu

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Gain Stabilization Methodology for FinFET Amplifiers Considering Self-Heating Effect.

Shashank Banchhor, Nitanshu Chauhan, Aditya Doneria, Bulusu Anand

Proceedings of the 34th International Conference on VLSI Design and 20th International Conference on Embedded Systems, 2021

Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET.

Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification.

Nitanshu Chauhan, Govind Bajpai, Shashank Banchhor, Navjeet Bagga

Proceedings of the 2020 24th International Symposium on VLSI Design and Test (VDAT), 2020