Seyab Khan

According to our database, Seyab Khan authored at least 10 papers between 2010 and 2014.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2014

Bias Temperature Instability analysis of FinFET based SRAM cells.

Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity.

Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor

Proceedings of the 8th International Design and Test Symposium, 2013

BTI impact on SRAM sense amplifier.

Innocent Agbo, Seyab Khan, Said Hamdioui

Proceedings of the 8th International Design and Test Symposium, 2013

Bias temperature instability analysis in SRAM decoder.

Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Incorporating parameter variations in BTI impact on nano-scale logical gates analysis.

Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

BTI impact on logical gates in nano-scale CMOS technology.

Seyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011

Modeling and mitigating NBTI in nanoscale circuits.

Seyab Khan, Said Hamdioui

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

ReverseAge: An online NBTI combating technique using time borrowing.

Seyab Khan, Said Hamdioui

Proceedings of the 6th IEEE International Design and Test Workshop, 2011

NBTI Monitoring and Design for Reliability in Nanoscale Circuits.

Seyab Khan, Nor Zaidi Haron, Said Hamdioui, Francky Catthoor

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

2010

Temperature dependence of NBTI induced delay.

Seyab Khan, Said Hamdioui

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010