Seungyong Doh

According to our database, Seungyong Doh authored at least 4 papers between 2009 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Improvement of virtual metrology performance by removing metrology noises in a training dataset.

Dongil Kim, Pilsung Kang, Seung-kyung Lee, Seokho Kang, Seungyong Doh, Sungzoon Cho

Pattern Anal. Appl., 2015

2012

Machine learning-based novelty detection for faulty wafer detection in semiconductor manufacturing.

Dongil Kim, Pilsung Kang, Sungzoon Cho, Hyoungjoo Lee, Seungyong Doh

Expert Syst. Appl., 2012

2011

Virtual metrology for run-to-run control in semiconductor manufacturing.

Pilsung Kang, Dongil Kim, Hyoungjoo Lee, Seungyong Doh, Sungzoon Cho

Expert Syst. Appl., 2011

2009

A virtual metrology system for semiconductor manufacturing.

Pilsung Kang, Hyoungjoo Lee, Sungzoon Cho, Dongil Kim, Jinwoo Park, Chan-Kyoo Park, Seungyong Doh

Expert Syst. Appl., 2009