Seungjin Choo

According to our database1, Seungjin Choo authored at least 5 papers between 2015 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

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Bibliography

2023
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Reverse Body Bias Dependence of HCI Reliability in Advanced FinFET.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2018
Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015
Systematical study of 14nm FinFET reliability: From device level stress to product HTOL.
Proceedings of the IEEE International Reliability Physics Symposium, 2015


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