Seungjin Choo
According to our database1,
Seungjin Choo
authored at least 5 papers
between 2015 and 2023.
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Bibliography
2023
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2018
Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2015
Systematical study of 14nm FinFET reliability: From device level stress to product HTOL.
Proceedings of the IEEE International Reliability Physics Symposium, 2015