Sergey V. Lebedev

According to our database1, Sergey V. Lebedev authored at least 1 paper in 2017.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

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Links

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Bibliography

2017
Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C).
Microelectron. Reliab., 2017


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