Sergey Bychikhin
According to our database1,
Sergey Bychikhin
authored at least 19 papers
between 2001 and 2013.
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Collaborative distances:
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2013
Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs on SiC and Si substrates for power applications.
Microelectron. Reliab., 2013
2012
IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab., 2012
Electro-thermal characterization and simulation of integrated multi-trenched XtreMOS<sup>TM</sup> power devices.
Microelectron. J., 2012
2011
Application of transient interferometric mapping method for ESD and latch-up analysis.
Microelectron. Reliab., 2011
2010
Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation.
Microelectron. Reliab., 2010
2009
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
Microelectron. Reliab., 2009
2007
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices.
Microelectron. Reliab., 2007
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.
Microelectron. Reliab., 2007
Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping.
Microelectron. Reliab., 2007
2006
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectron. Reliab., 2006
2005
Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices.
IEEE Trans. Instrum. Meas., 2005
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectron. Reliab., 2005
2004
Microelectron. Reliab., 2004
Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress.
Microelectron. Reliab., 2004
2003
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectron. Reliab., 2003
2002
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique.
Microelectron. Reliab., 2002
2001
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.
Microelectron. Reliab., 2001
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectron. Reliab., 2001