Sergej Deutsch

According to our database, Sergej Deutsch authored at least 26 papers between 2011 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Cryptographic Capability Computing.

Michael LeMay, Joydeep Rakshit, Sergej Deutsch, David M. Durham, Santosh Ghosh, Anant Nori, Jayesh Gaur, Andrew Weiler, Salmin Sultana, Karanvir Grewal, Sreenivas Subramoney

Proceedings of the MICRO '21: 54th Annual IEEE/ACM International Symposium on Microarchitecture, 2021

2020

Κ-Cipher: A Low Latency, Bit Length Parameterizable Cipher.

Michael E. Kounavis, Sergej Deutsch, Santosh Ghosh, David Durham

IACR Cryptol. ePrint Arch., 2020

The MAGIC Mode for Simultaneously Supporting Encryption, Message Authentication and Error Correction.

Michael E. Kounavis, David Durham, Sergej Deutsch, Krystian Matusiewicz, David Wheeler

IACR Cryptol. ePrint Arch., 2020

Gimli Encryption in 715.9 psec.

Santosh Ghosh, Michael E. Kounavis, Sergej Deutsch

IACR Cryptol. ePrint Arch., 2020

Security definitions, entropy measures and constructions for implicitly detecting data corruption.

Michael E. Kounavis, David Durham, Sergej Deutsch, Ken Grewal

Comput. Commun., 2020

K-Cipher: A Low Latency, Bit Length Parameterizable Cipher.

Michael E. Kounavis, Sergej Deutsch, Santosh Ghosh, David Durham

Proceedings of the IEEE Symposium on Computers and Communications, 2020

2019

IVP: A Three Level Confusion-Diffusion Network Supporting Implicit Data Integrity.

Michael E. Kounavis, David Durham, Sergej Deutsch, Ken Grewal

Proceedings of the 2019 IEEE Symposium on Computers and Communications, 2019

2018

Cryptographic Constructions Supporting Implicit Data Integrity.

Michael E. Kounavis, David Durham, Sergej Deutsch, Antonios Papadimitriou, Amitabh Das

IACR Cryptol. ePrint Arch., 2018

Implicit Data Integrity: Protecting User Data without MACs.

Michael E. Kounavis, David Durham, Sergej Deutsch, Saeedeh Komijani

Proceedings of the 15th International Joint Conference on e-Business and Telecommunications, 2018

There is No Need to Waste Communication Bandwidth on MACs.

Michael E. Kounavis, David Durham, Sergej Deutsch, Saeedeh Komijani, Antonios Papadimitriou, Ken Grewal

Proceedings of the 2018 Global Information Infrastructure and Networking Symposium, 2018

2017

Non-recursive computation of the probability of more than two people having the same birthday.

Michael E. Kounavis, Sergej Deutsch, David Durham, Saeedeh Komijani

Proceedings of the 2017 IEEE Symposium on Computers and Communications, 2017

2016

The hype, myths, and realities of testing 3D integrated circuits.

Ran Wang, Sergej Deutsch, Mukesh Agrawal, Krishnendu Chakrabarty

Proceedings of the 35th International Conference on Computer-Aided Design, 2016

2015

Robust Optimization of Test-Access Architectures Under Realistic Scenarios.

Sergej Deutsch, Krishnendu Chakrabarty, Erik Jan Marinissen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Test and debug solutions for 3D-stacked integrated circuits.

Sergej Deutsch, Krishnendu Chakrabarty

Proceedings of the 2015 IEEE International Test Conference, 2015

Contactless pre-bond TSV fault diagnosis using duty-cycle detectors and ring oscillators.

Sergej Deutsch, Krishnendu Chakrabarty

Proceedings of the 2015 IEEE International Test Conference, 2015

Software-based test and diagnosis of SoCs using embedded and wide-I/O DRAM.

Sergej Deutsch, Krishnendu Chakrabarty

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

2014

Contactless Pre-Bond TSV Test and Diagnosis Using Ring Oscillators and Multiple Voltage Levels.

Sergej Deutsch, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Test and Design-for-Testability Solutions for 3D Integrated Circuits.

Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye

IPSJ Trans. Syst. LSI Des. Methodol., 2014

Vesuvius-3D: A 3D-DfT demonstrator.

Erik Jan Marinissen, Bart De Wachter, Stephen O'Loughlin, Sergej Deutsch, Christos Papameletis, Tobias Burgherr

Proceedings of the 2014 International Test Conference, 2014

Massive signal tracing using on-chip DRAM for in-system silicon debug.

Sergej Deutsch, Krishnendu Chakrabarty

Proceedings of the 2014 International Test Conference, 2014

2013

Uncertainty-aware robust optimization of test-access architectures for 3D stacked ICs.

Sergej Deutsch, Krishnendu Chakrabarty, Erik Jan Marinissen

Proceedings of the 2013 IEEE International Test Conference, 2013

Robust optimization of test-architecture designs for core-based SoCs.

Sergej Deutsch, Krishnendu Chakrabarty

Proceedings of the 18th IEEE European Test Symposium, 2013

Non-invasive pre-bond TSV test using ring oscillators and multiple voltage levels.

Sergej Deutsch, Krishnendu Chakrabarty

Proceedings of the Design, Automation and Test in Europe, 2013

2012

DfT architecture and ATPG for Interconnect tests of JEDEC Wide-I/O memory-on-logic die stacks.

Sergej Deutsch, Brion L. Keller, Vivek Chickermane, Subhasish Mukherjee, Navdeep Sood, Sandeep Kumar Goel, Ji-Jan Chen, Ashok Mehta, Frank Lee, Erik Jan Marinissen

Proceedings of the 2012 IEEE International Test Conference, 2012

TSV Stress-Aware ATPG for 3D Stacked ICs.

Sergej Deutsch, Krishnendu Chakrabarty, Shreepad Panth, Sung Kyu Lim

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Automation of 3D-DfT Insertion.

Sergej Deutsch, Vivek Chickermane, Brion L. Keller, Subhasish Mukherjee, Mario Konijnenburg, Erik Jan Marinissen, Sandeep Kumar Goel

Proceedings of the 20th IEEE Asian Test Symposium, 2011