Serge Ecoffey

According to our database, Serge Ecoffey authored at least 14 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

CMOS Compatible Hydrogen Sensor Using Platinum Gate and ALD-Aluminum Oxide.

Adham Elshaer, Serge Ecoffey, Abdelatif Jaouad, Stéphane Monfray, Dominique Drouin

Sensors, May, 2024

Towards scalable cryogenic quantum dot biasing using memristor-based DC sources.

Pierre-Antoine Mouny, Raphaël Dawant, Patrick Dufour, Matthieu Valdenaire, Serge Ecoffey, Michel Pioro-Ladriere, Yann Beilliard, Dominique Drouin

CoRR, 2024

2023

Analog programming of CMOS-compatible Al₂O₃/TiO_2-x memristor at 4.2 K after metal-insulator transition suppression by cryogenic reforming.

Pierre-Antoine Mouny, Raphaël Dawant, Bastien Galaup, Serge Ecoffey, Michel Pioro-Ladriere, Yann Beilliard, Dominique Drouin

CoRR, 2023

Hardware-aware Training Techniques for Improving Robustness of Ex-Situ Neural Network Transfer onto Passive TiO2 ReRAM Crossbars.

Philippe Drolet, Raphaël Dawant, Victor Yon, Pierre-Antoine Mouny, Matthieu Valdenaire, Javier Arias-Zapata, Pierre Gliech, Sean U. N. Wood, Serge Ecoffey, Fabien Alibart, Yann Beilliard, Dominique Drouin

CoRR, 2023

2022

CODEX: Stochastic Encoding Method to Relax Resistive Crossbar Accelerator Design Requirements.

Tony Liu, Amirali Amirsoleimani, Jianxiong Xu, Fabien Alibart, Yann Beilliard, Serge Ecoffey, Dominique Drouin, Roman Genov

IEEE Trans. Circuits Syst. II Express Briefs, 2022

Memristor-based cryogenic programmable DC sources for scalable in-situ quantum-dot control.

Pierre-Antoine Mouny, Yann Beilliard, Sébastien Graveline, Marc-Antoine Roux, Abdelouadoud El Mesoudy, Raphaël Dawant, Pierre Gliech, Serge Ecoffey, Fabien Alibart, Michel Pioro-Ladriere, Dominique Drouin

CoRR, 2022

2021

AIDX: Adaptive Inference Scheme to Mitigate State-Drift in Memristive VMM Accelerators.

Tony Liu, Amirali Amirsoleimani, Fabien Alibart, Serge Ecoffey, Dominique Drouin, Roman Genov

IEEE Trans. Circuits Syst. II Express Briefs, 2021

Fully CMOS-compatible passive TiO2-based memristor crossbars for in-memory computing.

Abdelouadoud El Mesoudy, Gwénaëlle Lamri, Raphaël Dawant, Javier Arias-Zapata, Pierre Gliech, Yann Beilliard, Serge Ecoffey, Andreas Ruediger, Fabien Alibart, Dominique Drouin

CoRR, 2021

2020

In-Memory Vector-Matrix Multiplication in Monolithic Complementary Metal-Oxide-Semiconductor-Memristor Integrated Circuits: Design Choices, Challenges, and Perspectives.

Amirali Amirsoleimani, Fabien Alibart, Victor Yon, Jianxiong Xu, Mohammad Reza Pazhouhandeh, Serge Ecoffey, Yann Beilliard, Roman Genov, Dominique Drouin

Adv. Intell. Syst., 2020

2019

Observation of Highly Nonlinear Resistive Switching of Al2O3/TiO2-x Memristors at Cryogenic Temperature (1.5 K).

Yann Beilliard, François Paquette, Frédéric Brousseau, Serge Ecoffey, Fabien Alibart, Dominique Drouin

CoRR, 2019

2018

Towards miniaturized pH sensor based on carbon nanotubes assembled by DEP on titanium electrodes?

Arbi Maalaoui, Marie Frénéa-Robin, Jonathan Genest, Serge Ecoffey, Jacques Beauvais, Paul G. Charette, Dominique Drouin, Jean-Pierre Cloarec

Proceedings of the IEEE International Conference on Industrial Technology, 2018

2017

Development of ultrasensitive extended-gate Ion-sensitive-field-effect-transistor based on industrial UTBB FDSOI transistor.

Getenet Tesega Ayele, Stéphane Monfray, Frédéric Boeuf, Jean-Pierre Cloarec, Serge Ecoffey, Dominique Drouin, Etienne Puyoo, Abdelkader Souifi

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2016

A manufacturable process for single electron charge detection, a step towards quantum computing.

Gabriel Droulers, Serge Ecoffey, Dominique Drouin, Michel Pioro-Ladriere

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2015

3D microelectronic with BEOL compatible devices.

Dominique Drouin, Mohamed Amine-Bounouar, Gabriel Droulers, M. Labalette, Michel Pioro-Ladriere, A. Souifi, Serge Ecoffey

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015