Serge Agnel

According to our database, Serge Agnel authored at least 5 papers between 2007 and 2014.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2014

Contactless electric field and space charge measurement across solid dielectrics: A fully non-intrusive thermal technique.

Jean-Charles Laurentie, Hanen Yahyaoui, Petru V. Notingher, Jerome Castellon, Serge Agnel

Proceedings of the 2014 IEEE Industry Application Society Annual Meeting, 2014

Advances in electric charge measurements in semi-conducting structures by non-destructive thermal methods.

Sylvain Baudon, Petru V. Notingher, Serge Agnel, Stéphane Holé

Proceedings of the 2014 IEEE Industry Application Society Annual Meeting, 2014

2010

Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures.

Ludovic Boyer, Petru Notingher Jr., Serge Agnel, Bernard Rousset, Jean-Louis Sanchez

Proceedings of the Annual Meeting of the IEEE Industry Applications Society, 2010

2008

Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach.

Ludovic Boyer, Olivier Fruchier, Petru Notingher Jr., Serge Agnel, Alain Toureille, Bernard Rousset, Jean-Louis Sanchez

Proceedings of the Industry Applications Society Annual Meeting, 2008

2007

Applications of the Thermal Step Method to the Characterization of Electric Charge in MOS Components.

Olivier Fruchier, Petru Notingher Jr., Serge Agnel, Alain Toureille, F. Forest, S. Cunningham, Bernard Rousset, Jean-Louis Sanchez

Proceedings of the Conference Record of the 2007 IEEE Industry Applications Conference Forty-Second IAS Annual Meeting, 2007