Seppe Bormans
Orcid: 0000-0002-9890-917X
According to our database1,
Seppe Bormans
authored at least 3 papers
between 2020 and 2021.
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Bibliography
2021
Introducing a Thermal-Based Method for Measuring Dynamic Thin Film Thickness in Real Time as a Tool for Sensing Applications.
IEEE Trans. Instrum. Meas., 2021
2020
Measuring Thermal Conductivity in a Microfluidic Device with the Transient Thermal Offset (TTO) Method.
Proceedings of the 2020 IEEE Sensors, Rotterdam, The Netherlands, October 25-28, 2020, 2020