Seok-Hun Hyun
According to our database1,
Seok-Hun Hyun
authored at least 13 papers
between 2009 and 2021.
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Bibliography
2021
Adapting Internet of Things to Arduino-based Devices for Low-Cost Remote Sensing in School Science Learning Environments.
Int. J. Online Biomed. Eng., 2021
2019
A 5Gb/s/pin 16Gb LPDDR4/4X Reconfigurable SDRAM with Voltage-High Keeper and a Prediction-based Fast-tracking ZQ Calibration.
Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019
A 7.5Gb/s/pin LPDDR5 SDRAM With WCK Clocking and Non-Target ODT for High Speed and With DVFS, Internal Data Copy, and Deep-Sleep Mode for Low Power.
Proceedings of the IEEE International Solid- State Circuits Conference, 2019
2018
A Time-Based Receiver With 2-Tap Decision Feedback Equalizer for Single-Ended Mobile DRAM Interface.
IEEE J. Solid State Circuits, 2018
Dual-Loop Two-Step ZQ Calibration for Dynamic Voltage-Frequency Scaling in LPDDR4 SDRAM.
IEEE J. Solid State Circuits, 2018
A sub-0.85V, 6.4GBP/S/Pin TX-Interleaved Transceiver with Fast Wake-Up Time Using 2-Step Charging Control and VOHCalibration in 20NM DRAM Process.
Proceedings of the 2018 IEEE Symposium on VLSI Circuits, 2018
A 16Gb LPDDR4X SDRAM with an NBTI-tolerant circuit solution, an SWD PMOS GIDL reduction technique, an adaptive gear-down scheme and a metastable-free DQS aligner in a 10nm class DRAM process.
Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018
An Enhanced Built-off-Test Transceiver with Wide-range, Self-calibration Engine for 3.2 Gb/s/pin DDR4 SDRAM.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2018
2017
23.7 A time-based receiver with 2-tap DFE for a 12Gb/s/pin single-ended transceiver of mobile DRAM interface in 0.8V 65nm CMOS.
Proceedings of the 2017 IEEE International Solid-State Circuits Conference, 2017
23.2 A 5Gb/s/pin 8Gb LPDDR4X SDRAM with power-isolated LVSTL and split-die architecture with 2-die ZQ calibration scheme.
Proceedings of the 2017 IEEE International Solid-State Circuits Conference, 2017
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2017
2013
A 1.2 V 30 nm 3.2 Gb/s/pin 4 Gb DDR4 SDRAM With Dual-Error Detection and PVT-Tolerant Data-Fetch Scheme.
IEEE J. Solid State Circuits, 2013
2009
1.2V 1.6Gb/s 56nm 6F<sup>2</sup> 4Gb DDR3 SDRAM with hybrid-I/O sense amplifier and segmented sub-array architecture.
Proceedings of the IEEE International Solid-State Circuits Conference, 2009