Sekhar Reddy Kola
Orcid: 0000-0003-2022-643X
According to our database1,
Sekhar Reddy Kola
authored at least 6 papers
between 2022 and 2023.
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Bibliography
2023
Application of long short-term memory modeling technique to predict process variation effects of stacked gate-all-around Si nanosheet complementary-field effect transistors.
Comput. Electr. Eng., January, 2023
Exploring the Performance of 3-D Nanosheet FET in Inversion and Junctionless Modes: Device and Circuit-Level Analysis and Comparison.
IEEE Access, 2023
Intrinsic Parameter Fluctuation and Process Variation Effect of Vertically Stacked Silicon Nanosheet Complementary Field-Effect Transistors.
Proceedings of the 24th International Symposium on Quality Electronic Design, 2023
2022
A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of Gate-All-Around Si Nanosheet MOSFETs.
IEEE Access, 2022
A Unified Statistical Analysis of Comprehensive Fluctuations of Gate-All-Around Silicon Nanosheet MOSFETs Induced by RDF, ITF, and WKF Simultaneously.
Proceedings of the 23rd International Symposium on Quality Electronic Design, 2022
Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs Induced by Random Interface Traps.
Proceedings of the 23rd International Symposium on Quality Electronic Design, 2022