Seiji Inumiya

According to our database1, Seiji Inumiya authored at least 2 papers between 2007 and 2013.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

2007
2008
2009
2010
2011
2012
2013
0
1
2
1
1

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2013
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing.
Microelectron. Reliab., 2013

2007
Evaluation of Dielectric Reliability of Ultrathin HfSiO<sub>x</sub>N<sub>y</sub> in Metal-Gate Capacitors.
IEICE Trans. Electron., 2007


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