Sebastià A. Bota

Orcid: 0000-0002-7653-0740

According to our database1, Sebastià A. Bota authored at least 64 papers between 1996 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
SRAM Alpha-SER Estimation From Word-Line Voltage Margin Measurements: Design Architecture and Experimental Results.
CoRR, 2024

A 164-dBΩ Transimpedance Amplifier for Monolithic CMOS-MEMS Oscillators in Biosensing Applications.
IEEE Access, 2024

2023
A Compact Double-Exponential Circuit for Single Event Transient Emulation.
Proceedings of the 38th Conference on Design of Circuits and Integrated Systems, 2023

2022
Fully Integrated Front-End CMOS-MEMS Transducer for Low-Cost Real-Time Breath Monitoring.
Proceedings of the 2022 IEEE Sensors, Dallas, TX, USA, October 30 - Nov. 2, 2022, 2022

SRAM-cells Reproducibility Metrics for Physical Unclonable Function Applications.
Proceedings of the 37th Conference on Design of Circuits and Integrated Systems, 2022

2021
A Bulk-Controlled Low-Voltage CMOS Quadrature Oscillator.
CoRR, 2021

2020
Impact of Fluid Flow on CMOS-MEMS Resonators Oriented to Gas Sensing.
Sensors, 2020

Bit-Cell Selection Analysis for Embedded SRAM-Based PUF.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

Selection of SRAM Cells to improve Reliable PUF implementation using Cell Mismatch Metric.
Proceedings of the XXXV Conference on Design of Circuits and Integrated Systems, 2020

2019
A 65-nm Reliable 6T CMOS SRAM Cell with Minimum Size Transistors.
IEEE Trans. Emerg. Top. Comput., 2019

Weak and Strong SRAM cells analysis in embedded memories for PUF applications.
Proceedings of the XXXIV Conference on Design of Circuits and Integrated Systems, 2019

2018
Thermomechanical Noise Characterization in Fully Monolithic CMOS-MEMS Resonators.
Sensors, 2018

Frequency Fluctuations in CMOS-MEMS Oscillators: Towards the Thermomechanical Limit.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

Bistability in a CMOS-MEMS Thermally Tuned Microbeam Resonator.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

2017
Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources.
Microelectron. Reliab., 2017

Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells.
Proceedings of the 14th International Conference on Synthesis, 2017

6T CMOS SRAMs reliability monitoring through stability measurements.
Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Cantilever NEMS relay-based SRAM devices for enhanced reliability.
Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

2016
An affordable experimental technique for SRAM write margin characterization for nanometer CMOS technologies.
Microelectron. Reliab., 2016

Electrostatically actuated microbeam resonators as chaotic signal generators: A practical perspective.
Commun. Nonlinear Sci. Numer. Simul., 2016

On-line write margin estimator to monitor performance degradation in SRAM cores.
Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2015
Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell.
Proceedings of the 16th Latin-American Test Symposium, 2015

2014
Sensitization Input Vector Impact on Propagation Delay for Nanometer CMOS ICs: Analysis and Solutions.
IEEE Trans. Very Large Scale Integr. Syst., 2014

Adaptive static and dynamic noise margin improvement in minimum-sized 6T-SRAM cells.
Microelectron. Reliab., 2014

Analysis of fin height on FinFET SRAM cell hardening.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

Word-line power supply selector for stability improvement of embedded SRAMs in high reliability applications.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013
Alternate characterization technique for static random-access memory static noise margin determination.
Int. J. Circuit Theory Appl., 2013

Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias.
Proceedings of the 14th Latin American Test Workshop, 2013

Accurate alpha soft error rate evaluation in SRAM memories.
Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

2012
Resistive bridge defect detection enhancement under parameter variations combining Low V<sub>DD</sub> and body bias in a delay based test.
Microelectron. Reliab., 2012

2011
8T vs. 6T SRAM cell radiation robustness: A comparative analysis.
Microelectron. Reliab., 2011

An efficient and scalable STA tool with direct path estimation and exhaustive sensitization vector exploration for optimal delay computation.
Proceedings of the Design, Automation and Test in Europe, 2011

Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation.
Proceedings of the Design, Automation and Test in Europe, 2011

2010
Application of Predictive Oscillation-Based Test to a CMOS OpAmp.
IEEE Trans. Instrum. Meas., 2010

Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination.
IEEE Trans. Circuits Syst. II Express Briefs, 2010

Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories.
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs.
Proceedings of the Design, Automation and Test in Europe, 2010

2009
Predictive test strategy for CMOS RF mixers.
Integr., 2009

Predictive Test Technique for Diagnosis of RF CMOS Receivers.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Critical charge characterization in 6-T SRAMs during read mode.
Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2008
A simple CMOS chaotic integrated circuit.
IEICE Electron. Express, 2008

2007
A Module for BiST of CMOS RF Receivers.
J. Electron. Test., 2007

Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment.
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs.
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006
Force-balance interface circuit based on floating MOSFET capacitors for micro-machined capacitive accelerometers.
IEEE Trans. Circuits Syst. II Express Briefs, 2006

Impact of Thermal Gradients on Clock Skew and Testing.
IEEE Des. Test Comput., 2006

Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Leakage Power Characterization Considering Process Variations.
Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2006

A Fully CMOS Low-Cost Chaotic Neural Network.
Proceedings of the International Joint Conference on Neural Networks, 2006

2005
Compact Static Power Model of Complex CMOS Gates.
Proceedings of the Integrated Circuit and System Design, 2005

A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits.
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs.
Proceedings of the 2005 Design, 2005

Smart Temperature Sensor for Thermal Testing of Cell-Based ICs.
Proceedings of the 2005 Design, 2005

2004
A reusable smart interface for gas sensor resistance measurement.
IEEE Trans. Instrum. Meas., 2004

Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

A mixed-mode temperature control circuit for gas sensors.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA.
Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

2002
A miniature robot driven by smart power integrated circuits.
Proceedings of the IEEE/RSJ International Conference on Intelligent Robots and Systems, Lausanne, Switzerland, September 30, 2002

2001
Smart Temperature Sensor for On-Line Monitoring in Automotive Applications.
Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001

SPU based microrobots: a new approach to the robotic world.
Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001

High accuracy piezoelectric-based microrobot for biomedical applications.
Proceedings of 8th IEEE International Conference on Emerging Technologies and Factory Automation, 2001

1999
A MOSFET-only second order delta-sigma modulator for capacitive sensor interfaces.
Proceedings of the 6th IEEE International Conference on Electronics, Circuits and Systems, 1999

1998
A current-mode interface circuit for a piezoresistive pressure sensor.
IEEE Trans. Instrum. Meas., 1998

1996
Implementation and design of a new model of neural network with application to typographical character recognition.
Proceedings of the Proceedings 1996 International Conference on Image Processing, 1996


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