Sean J. O'Shea

According to our database, Sean J. O'Shea authored at least 8 papers between 2007 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films.

Alok Ranjan, Sean J. O'Shea, Michel Bosman, J. Molina, Nagarajan Raghavan, Kin Leong Pey

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns.

Kin Leong Pey, Alok Ranjan, Nagarajan Raghavan, Kalya Shubhakar, Sean J. O'Shea

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics.

Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2016

Conductive filament formation at grain boundary locations in polycrystalline HfO₂ -based MIM stacks: Computational and physical insight.

Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey

Microelectron. Reliab., 2016

Analysis of quantum conductance, read disturb and switching statistics in HfO₂ RRAM using conductive AFM.

Alok Ranjan, Nagarajan Raghavan, Joel Molina Reyes, Sean J. O'Shea, Kalya Shubhakar, Kin Leong Pey

Microelectron. Reliab., 2016

2015

An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO₂/SiO_x dielectric stacks for failure analysis.

Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey

Microelectron. Reliab., 2015

2014

Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO₂ on reliability of SiO_x interfacial layer.

Kalya Shubhakar, Nagarajan Raghavan, Sunil Singh Kushvaha, Michel Bosman, Zhongrui Wang, Sean J. O'Shea, Kin Leong Pey

Microelectron. Reliab., 2014

2007

Room temperature observation of point defect on gold surface using thermovoltage mapping.

Arijit Roy, Cher Ming Tan, Sean J. O'Shea, Kedar Hippalgaonkar, Wulf Hofbauer

Microelectron. Reliab., 2007