Se Re Na Yun

According to our database, Se Re Na Yun authored at least 3 papers between 2003 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors.

In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong Tae Park

Microelectron. Reliab., 2006

2004

Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's.

Se Re Na Yun, Chong-Gun Yu, Seok Hee Jeon, Chungkyue Kim, Jong Tae Park, Jean-Pierre Colinge

Microelectron. Reliab., 2004

2003

Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at room and elevated temperatures.

Se Re Na Yun, Won Sub Park, Byung Ha Lee, Jong Tae Park

Microelectron. Reliab., 2003