Scott Sills

According to our database, Scott Sills authored at least 2 papers in 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Challenges for high-density 16Gb ReRAM with 27nm technology.

Scott Sills, Shuichiro Yasuda, Alessandro Calderoni, Christopher Cardon, Jonathan Strand, Katsuhisa Aratani, Nirmal Ramaswamy

Proceedings of the Symposium on VLSI Circuits, 2015

Understanding pulsed-cycling variability and endurance in HfOx RRAM.

Simone Balatti, Stefano Ambrogio, Zhongqiang Wang, Scott Sills, Alessandro Calderoni, Nirmal Ramaswamy, Daniele Ielmini

Proceedings of the IEEE International Reliability Physics Symposium, 2015