Scott Davidson
Orcid: 0000-0002-9390-6084Affiliations:
- Oracle Corp, Santa Clara, CA, USA
- AT&T Bell Laboratories, Princeton, NJ, USA
- Sun Microsystems, Sunnyvale, CA, USA (former)
- University of Louisiana at Lafayette, LA, USA (PhD)
According to our database1,
Scott Davidson
authored at least 140 papers
between 1975 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
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Online presence:
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on linkedin.com
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on orcid.org
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on dl.acm.org
On csauthors.net:
Bibliography
2024
2023
2022
2021
2020
2019
2018
Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology and Electronic Design Automation for IC System Design, Verification, and Testing.
IEEE Des. Test, 2018
2017
IEEE Des. Test, 2017
2016
2015
2014
2013
2012
Proceedings of the 2012 IEEE International Test Conference, 2012
2011
All About Liquid Scan Chains - and More [review of "Digital Microfluidic Biochips: Design Automation and Optimization" (Chakrabarty, K. and Xu, T.; 2010)].
IEEE Des. Test Comput., 2011
Proceedings of the 2011 IEEE International Test Conference, 2011
2010
About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)].
IEEE Des. Test Comput., 2010
Concurrent checking for logic [review of "New Methods of Concurrent Checking (Goessel, M., et al; 2008)].
IEEE Des. Test Comput., 2010
2009
IEEE Des. Test Comput., 2009
A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)].
IEEE Des. Test Comput., 2009
Using transition test to understand timing behavior of logic circuits on UltraSPARC<sup>TM</sup> T2 family.
Proceedings of the 2009 IEEE International Test Conference, 2009
2008
IEEE Des. Test Comput., 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
2007
IEEE Des. Test Comput., 2007
2006
Proceedings of the 2006 IEEE International Test Conference, 2006
2005
IEEE Des. Test Comput., 2005
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
2004
Paperless Design and Test.
IEEE Des. Test Comput., 2004
2003
All I Know I Learned at ITC.
IEEE Des. Test Comput., 2003
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
2002
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002
2001
Welcome to 2001.
IEEE Des. Test Comput., 2001
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001
2000
IEEE Des. Test Comput., 2000
Testing in 2100.
IEEE Des. Test Comput., 2000
Twenty Years Ago Today.
IEEE Des. Test Comput., 2000
1999
How Do I Boot Thee? Let Me Check Page 3.
IEEE Des. Test Comput., 1999
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999
1998
The Last Byte.
IEEE Des. Test Comput., 1998
Minutes Found on a Cave Wall.
IEEE Des. Test Comput., 1998
The Newer Colossus.
IEEE Des. Test Comput., 1998
Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
1997
1996
How to achieve 95% fault coverage without really trying.
IEEE Des. Test Comput., 1996
Base 1 logic: A method for environmentally friendly PC design.
IEEE Des. Test Comput., 1996
1994
Proceedings of the Seventh International Conference on VLSI Design, 1994
Proceedings of the Proceedings IEEE International Test Conference 1994, 1994
1989
1986
ESIM/AFS : A Concurrent Architectural Level Fault Simulator.
Proceedings of the Proceedings International Test Conference 1986, 1986
1985
Proceedings of the 13th ACM Annual Conference on Computer Science, 1985
1984
Fault Simulation at the Architectural Level.
Proceedings of the Proceedings International Test Conference 1984, 1984
1981
IEEE Trans. Computers, 1981
Proceedings of the American Federation of Information Processing Societies: 1981 National Computer Conference, 1981
1980
Proceedings of the Firmware Engineering, 1980
1978
1976
Proceedings of the 4th Symposium on Simulation of Computer Systems, 1976
1975
Proceedings of the 8th annual workshop on Microprogramming, 1975