Scott Allen

Orcid: 0009-0006-8704-8454

According to our database1, Scott Allen authored at least 3 papers between 2018 and 2024.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

2018
2019
2020
2021
2022
2023
2024
0
1
2
1
1
1

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2024
Recognition: capture(scene).
Proceedings of the SIGGRAPH Asia 2024 Art Gallery, 2024

2022
Negative Gate Bias TDDB evaluation of n-Channel SiC Vertical Power MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2018
Reliability studies of SiC vertical power MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018


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