Satyadev Ahlawat
Orcid: 0000-0003-0186-1446
According to our database1,
Satyadev Ahlawat
authored at least 33 papers
between 2015 and 2025.
Collaborative distances:
Collaborative distances:
Timeline
2016
2018
2020
2022
2024
0
1
2
3
4
5
6
7
8
1
3
1
2
4
7
2
3
5
4
1
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
-
on orcid.org
On csauthors.net:
Bibliography
2025
B-CAVE: A Robust Online Time Series Change Point Detection Algorithm Based on the Between-Class Average and Variance Evaluation Approach.
IEEE Trans. Knowl. Data Eng., January, 2025
2024
A-TSPD: autonomous-two stage algorithm for robust peak detection in online time series.
Clust. Comput., July, 2024
DAT: A robust Discriminant Analysis-based Test of unimodality for unknown input distributions.
Pattern Recognit. Lett., 2024
Proceedings of the 21st International SoC Design Conference, 2024
Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024
2023
Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023
Proceedings of the IEEE International Conference on Service-Oriented System Engineering, 2023
Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023
Proceedings of the 32nd IEEE Asian Test Symposium, 2023
2022
Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022
Proceedings of the VLSI Design and Test - 26th International Symposium, 2022
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2022
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022
Proceedings of the GLSVLSI '22: Great Lakes Symposium on VLSI 2022, Irvine CA USA, June 6, 2022
Proceedings of the IEEE European Test Symposium, 2022
Proceedings of the IEEE 31st Asian Test Symposium, 2022
2021
J. Electron. Test., 2021
2019
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019
Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019
2018
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018
2017
Proceedings of the VLSI Design and Test - 21st International Symposium, 2017
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Proceedings of the 22nd IEEE European Test Symposium, 2017
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017
Proceedings of the 26th IEEE Asian Test Symposium, 2017
2016
Proceedings of the 20th International Symposium on VLSI Design and Test, 2016
Proceedings of the 20th International Symposium on VLSI Design and Test, 2016
Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016
Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016
2015
Proceedings of the 24th IEEE Asian Test Symposium, 2015