Sassan Tabatabaei
According to our database1,
Sassan Tabatabaei
authored at least 25 papers
between 1997 and 2020.
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Bibliography
2020
3.7 A 620µW BJT-Based Temperature-to-Digital Converter with 0.65mK Resolution and FoM of 190fJ·K<sup>2</sup>.
Proceedings of the 2020 IEEE International Solid- State Circuits Conference, 2020
2017
A MEMS-Assisted Temperature Sensor With 20-µK Resolution, Conversion Rate of 200 S/s, and FOM of 0.04 pJK2.
IEEE J. Solid State Circuits, 2017
2016
11.1 Dual-MEMS-resonator temperature-to-digital converter with 40 K resolution and FOM of 0.12pJK2.
Proceedings of the 2016 IEEE International Solid-State Circuits Conference, 2016
2013
A Temperature-to-Digital Converter for a MEMS-Based Programmable Oscillator With < ±0.5-ppm Frequency Stability and < 1-ps Integrated Jitter.
IEEE J. Solid State Circuits, 2013
2012
A temperature-to-digital converter for a MEMS-based programmable oscillator with better than ±0.5ppm frequency stability.
Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012
2010
2007
Design of a Tunable Differential Ring Oscillator With Short Start-Up and Switching Transients.
IEEE Trans. Circuits Syst. I Regul. Pap., 2007
2005
IEEE Trans. Instrum. Meas., 2005
A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices.
J. Electron. Test., 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
2004
IEEE Des. Test Comput., 2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
2003
IEEE Des. Test Comput., 2003
Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing.
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003
2002
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002
2000
Defect Oriented Testing of an ECL/CMOS Level Converter Circuit.
Proceedings of the 1st Latin American Test Workshop, 2000
1999
Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999
Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30, 1999
1998
Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998
1997
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997