Sasikumar Cherubal

According to our database, Sasikumar Cherubal authored at least 20 papers between 1997 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2010

Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices.

Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam

J. Electron. Test., 2010

2007

Signature Testing of Analog and RF Circuits: Algorithms and Methodology.

Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee

IEEE Trans. Circuits Syst. I Regul. Pap., 2007

2006

DIBPro: Automatic Diagnostic Program Generation Tool.

Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers.

Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee

Proceedings of the 10th European Test Symposium, 2005

Challenges in Next Generation Mixed-Signal IC Production Testing.

Sasikumar Cherubal

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.

Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Concurrent RF Test Using Optimized Modulated RF Stimuli.

Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences.

Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit.

Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 2004 Design, 2004

2003

Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results.

Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Prediction of analog performance parameters using fast transienttesting.

Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

A Signature Test Framework for Rapid Production Testing of RF Circuits.

Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 2002 Design, 2002

2001

A high-resolution jitter measurement technique using ADC sampling.

Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

Test generation based diagnosis of device parameters for analog circuits.

Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

2000

An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards.

Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

Optimal INL/DNL testing of A/D converters using a linear model.

Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Test generation for fault isolation in analog circuits using behavioral models.

Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1999

A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms.

Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

Parametric Fault Diagnosis for Analog Systems Using Functional Mapping.

Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 1999 Design, 1999

1997

Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis.

Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997