Sara Carniello

According to our database, Sara Carniello authored at least 4 papers between 2007 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Modelling and measurements of thermomechanical stress induced drift on polysilicon resistors with different layout.

Lorenzo Benvenuti, Paolo Bruschi, Luca Fanucci, Raffaele Coppeta, Sara Carniello, Luigi Di Piro, Francesco Tinfena

Proceedings of the 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2019

2015

Intrinsic stress analysis of tungsten-lined open TSVs.

Lado Filipovic, Anderson Pires Singulani, Frederic Roger, Sara Carniello, Siegfried Selberherr

Microelectron. Reliab., 2015

2010

Interface traps density-of-states as a vital component for hot-carrier degradation modeling.

Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser

Microelectron. Reliab., 2010

2007

Analysis of hot carrier effects in a 0.35 µm high voltage n-channel LDMOS transistor.

Hubert Enichlmair, Sara Carniello, Jong Mun Park, Rainer Minixhofer

Microelectron. Reliab., 2007