Sanping Wan
Orcid: 0009-0005-0202-4633
According to our database1,
Sanping Wan
authored at least 4 papers
between 2009 and 2024.
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Collaborative distances:
Timeline
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2024
Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization.
ACM Trans. Design Autom. Electr. Syst., 2024
2018
New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2010
Proceedings of the 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2010
2009
Analysis on electro-thermal property of micro-bubble generator using carbon nanotube heating elements.
Proceedings of the 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2009