Sangku Park
According to our database1,
Sangku Park
authored at least 3 papers
between 2010 and 2024.
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Bibliography
2024
V-Ramp VBD Prediction Method Using OCD-Spectrum and Deep-Learning, and Application to Early Detection of V-NAND Low Metal Reliability Risk.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2010
Proceedings of the 17th IEEE International Conference on Electronics, 2010