Sangchul Shin
According to our database1,
Sangchul Shin
authored at least 8 papers
between 2005 and 2019.
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Bibliography
2019
Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Optimal design of dummy ball array in wafer level package to improve board level thermal cycle reliability (BLR).
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2015
Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2006
Proceedings of the Management of Convergence Networks and Services, 2006
2005
Proceedings of the Advances in Multimedia Information Processing, 2005