Sang Jeen Hong

Orcid: 0000-0002-6576-690X

According to our database1, Sang Jeen Hong authored at least 13 papers between 2005 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
Wafer Type Ion Energy Monitoring Sensor for Plasma Diagnosis.
Sensors, March, 2023

Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data.
Sensors, February, 2023

2014
Fault Detection in the Semiconductor Etch Process Using the Seasonal Autoregressive Integrated Moving Average Modeling.
J. Inf. Process. Syst., 2014

2013
Time Series Fault Prediction in Semiconductor Equipment Using Recurrent Neural Network.
Proceedings of the Advances in Neural Networks - ISNN 2013, 2013

2010
Endpoint Detection of SiO<sub>2</sub> Plasma Etching Using Expanded Hidden Markov Model.
Proceedings of the Advances in Neural Networks, 2010

2009
A comparison and analysis of genetic algorithm and particle swarm optimization using neural network models for high efficiency solar cell fabrication processes.
Proceedings of the FUZZ-IEEE 2009, 2009

2007
Characterization and Optimization of the Contact Formation for High-Performance Silicon Solar Cells.
Proceedings of the Advances in Neural Networks, 2007

2006
Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network.
Proceedings of the Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28, 2006

Modeling and Characterization of Plasma Processes Using Modular Neural Network.
Proceedings of the Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28, 2006

2005
Neural-Network-Based Sensor Fusion of Optical Emission and Mass Spectroscopy Data for Real-Time Fault Detection in Reactive Ion Etching.
IEEE Trans. Ind. Electron., 2005

Characterization of Negative Photoresist Processing by Statistical Design of Experiment (DOE).
J. Inform. and Commun. Convergence Engineering, 2005

Sensitivity Analysis of Plasma Charge-up Monitoring Sensor.
J. Inform. and Commun. Convergence Engineering, 2005

Equalization of a Wireless ATM Channel with Simplified Complex Bilinear Recurrent Neural Network.
Proceedings of the Advances in Natural Computation, First International Conference, 2005


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