Sandip Halder

According to our database, Sandip Halder authored at least 21 papers between 2011 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Advancing SEM Based Nano-Scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes.

Bappaditya Dey, Matthias Monden, Víctor Blanco, Sandip Halder, Stefan De Gendt

CoRR, 2024

An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection.

Amit Prasad, Bappaditya Dey, Victor Blanco, Sandip Halder

CoRR, 2024

Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images.

Bappaditya Dey, Vic De Ridder, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge

CoRR, 2024

Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS.

Ying-Lin Chen, Jacob Deforce, Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray

CoRR, 2024

2023

Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance.

Bappaditya Dey, Anh Tuan Ngo, Sara Sacchi, Víctor Blanco, Philippe Leray, Sandip Halder

CoRR, 2023

Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.

Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge

CoRR, 2023

Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

CoRR, 2023

Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE.

Sara Sacchi, Bappaditya Dey, Iacopo Mochi, Sandip Halder, Philippe Leray

CoRR, 2023

Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review.

Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt

CoRR, 2023

SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection.

Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge

CoRR, 2023

YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach.

Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt

CoRR, 2023

SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation.

Vic De Ridder, Bappaditya Dey, Sandip Halder, Bartel Van Waeyenberge

CoRR, 2023

A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

CoRR, 2023

SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering.

MinJin Hwang, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Young-han Shin

CoRR, 2023

Optimizing YOLOv7 for Semiconductor Defect Detection.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

CoRR, 2023

2022

Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach.

Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi

CoRR, 2022

Deep Learning-Based Defect Classification and Detection in SEM Images.

Bappaditya Dey, Dipam Goswami, Sandip Halder, Kasem Khalil, Philippe Leray, Magdy A. Bayoumi

CoRR, 2022

Code Generation Using Machine Learning: A Systematic Review.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt, Wannes Meert

IEEE Access, 2022

A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder

Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022

2020

Using Unsupervised Machine Learning for Plasma Etching Endpoint Detection.

Imen Chakroun, Thomas J. Ashby, Sayantan Das, Sandip Halder, Roel Wuyts, Wilfried Verachtert

Proceedings of the 9th International Conference on Pattern Recognition Applications and Methods, 2020

2011

In-line metrology and inspection for process control during 3D stacking of IC's.

Sandip Halder, Ingrid De Wolf, Alain Phommahaxay, Andy Miller, Mireille Maenhoudt, Gerald Beyer, Bart Swinnen, Eric Beyne

Proceedings of the 2011 IEEE International 3D Systems Integration Conference (3DIC), Osaka, Japan, January 31, 2011